BibTeX:

@article{IJIRSTV1I10023,
     title={Dielectric Properties of H- Phase [Ta2O5]1-x,[TiO2]x, (0.078 ≤ x ≤ 0.085)},
     author={M.K.Agarwal , Aradhana Bhandari, Alok S. Kandari , Vijendra Lingwal and N. S. Panwar},
     journal={International Journal for Innovative Research in Science & Technology},
     volume={1},
     number={10},
     pages={102--108},
     year={},
     url={http://www.ijirst.org/articles/IJIRSTV1I10023.pdf},
     publisher={IJIRST (International Journal for Innovative Research in Science & Technology)},
}

Composition (0.078 ≤ x ≤ 0.085), frequency (1 KHz – 1 MHz) and temperature (30 – 600 oC) dependence of dielectric constant, loss tangent and dielectric conductivity of [Ta2O5]1-x-[TiO2]x pellets, prepared by solid state reaction method, has been presented. The x-ray diffraction patterns and dielectric constant measurements show the occurrence of high- phase. Among the prepared compositions, dielectric constant was observed maximum for the composition with x = 0.080, at all the measured frequencies and temperatures (except near transition temperature). Dielectric properties were observed dominantly driven by composition rather than the frequency or temperature, in the present system. Dielectric constant was observed slowly increasing with temperature showing strong transition peaks at 495, 505, 510 and 520 oC for the compositions with x = 0.078, 0.080, 0.082 and 0.085, respectively. Dielectric loss and conductivity also show anomalous increase near the transition temperature, for all the prepared compositions. Near the transition temperature, anomalous dielectric behavior may be associated with the softening of the active phonon mode.

Ceramics; crystal growth; X-ray diffraction; dielectric properties; Phase Transition