BibTeX:

@article{IJIRSTV3I3045,
     title={Advances in Inspection Technology through Microcontroller Applications},
     author={PRADEEP D.G. and Dushyanth Kumar K.R},
     journal={International Journal for Innovative Research in Science & Technology},
     volume={3},
     number={3},
     pages={111--113},
     year={},
     url={http://www.ijirst.org/articles/IJIRSTV3I3045.pdf},
     publisher={IJIRST (International Journal for Innovative Research in Science & Technology)},
}

Competitive pressures across industries are forcing operational excellence, increased productivity and regulatory compliance, optimal asset utilization, reduction in downtime and safety related incidents. Real Time manufacturing systems are at the heart of industrial automation applications and thus, a time response mechanism is required to be able to improve such systems. Quality control and inspection has become a major tool in industrial production. New measurement systems using microcontroller have to be developed to fulfill control mechanisms effectively. Industrial automation means simplifying production jobs and providing speed and accuracy for work elements involved. This paper presents a survey of implementing microcontroller application to inspection field and its developments. Here the work involves related to automated inspection system, Infra-red Sensor on the conveyor belt to detect the production components and automatically stop the belt and the inspection data’s are stored on memory automatically. This automated inspection system will definitely enhance the production and market efficiencies with reduced cycle time is possible with simple setup.

Automated Quality Control, Microcontroller Applications, Advance in Inspection Technology